Development of an X-Ray Interferometer for High-Resolution Phase-Contrast X-Ray Imaging
نویسندگان
چکیده
An X-ray interferometer for high-resolution phase-contrast X-ray imaging was developed by thinning the central part of the analyzer crystal of a triple Laue-case (LLL) X-ray interferometer. The interferometer was tested at beamline 47XU at the SPring-8, and the improvement of the resolution of interference patterns was successfully observed for a plastic sphere of 1 mm diameter.
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